{"id":456,"date":"2023-03-20T15:47:23","date_gmt":"2023-03-20T06:47:23","guid":{"rendered":"https:\/\/kaneko-lab.ritsumei.ac.jp\/?page_id=456"},"modified":"2025-05-02T06:22:10","modified_gmt":"2025-05-01T21:22:10","slug":"2023_achievements","status":"publish","type":"page","link":"https:\/\/kaneko-lab.ritsumei.ac.jp\/en\/2023_achievements\/","title":{"rendered":"2023\u5e74 \u7814\u7a76\u696d\u7e3e"},"content":{"rendered":"<h2 id=\"1\">\u67fb\u8aad\u4ed8\u304d\u7814\u7a76\u8ad6\u6587<\/h2>\n<p>\u00a0\u00a0\u00a0 <span><\/span><\/p>\n<p>\u3000\uff08Review\u8ad6\u6587\uff09<\/p>\n<ol>\n<li><span style=\"text-decoration: underline;\">K. Kaneko<\/span>, S. Fujita, T. Shinohe, and K. Tanaka, &#8220;Progress of \u03b1-Ga2O3 for Actual Device Applications&#8221; Japanese Journal of Applied Physic Vol.62, No. SF pp.SF0803(1-10) (2023)<\/li>\n<\/ol>\n<p>\u00a0\u00a0 \uff08\u62db\u5f85\u8ad6\u6587\uff09<\/p>\n<ol>\n<li><span>H. Takane, H. Izumi, H. Hojo, T. Wakamatsu, T. Araki, K. Tanaka, and\u00a0<span style=\"text-decoration: underline;\">K. Kaneko<\/span>, \u201cEffect of dislocations and impurities on carrier transport in \u03b1-Ga2O3 on m-plane sapphire substrate\u201d Journal of Materials Research, Vol.38, pp.2645\u20132654 (2023)<\/span><\/li>\n<\/ol>\n<p>\u3000\u00a0 (\u5b66\u8853\u8ad6\u6587\uff09<\/p>\n<ol>\n<li><span>H. Takane, T. Oshima , T. Harada, <span style=\"text-decoration: underline;\">K. Kaneko<\/span>, and K. Tanaka \u201cRutile-type GexSn1\u2212xO2 alloy layers lattice-matched to TiO2 substrates for device applications\u201d Applied Physic Express, Vol.17, 011008 pp.1-4 (2024)<\/span><\/li>\n<li>Y.Ota, <span style=\"text-decoration: underline;\">K. Kaneko<\/span>, T. Onuma, and S. Fujita, \u201cNatural band alignment of MgO1-XSX alloys\u201d AIP Advance Vol.13, pp.055304(1-7) (2023)<\/li>\n<li>H. Takane, I. Kakeya, H. Izumi, T. Wakamatsu, Y.\u00a0 Isobe, <span style=\"text-decoration: underline;\">K. Kaneko<\/span>, and K. Tanaka, \u201cLow-temperature electron transport of rutile-type GexSn1\u2212xO2\u201d J. Appl. Phys. Vol.134, 165706 pp. 1-10 (2023)<\/li>\n<li>K.\u00a0 Ogawa, W. Kosaka, H. Kusaka, K. Kudo, S. Ohno, I. Sereizawa , Y. Ota, T. Yamaguchi, T. Honda,\u00a0 <span style=\"text-decoration: underline;\">K. Kaneko<\/span>,\u00a0 S. Fujita, T. Onuma, \u201cRealization of cathodoluminescence in 180 nm spectral range by suppressing thermal stress in mist chemical vapor deposition of rocksalt-structured MgZnO films\u201d, Japanese Journal of Applied Physic Vol.63, No. 2 pp.02SP30(1-8) (2023)<\/li>\n<li>H. Takane, T. Oshima, K. Tanaka, and <span style=\"text-decoration: underline;\">K. Kaneko<\/span>,\u201d Growth dynamics of selective-area-grown rutile-type SnO2 on TiO2 (110) substrate\u201d Applied Physic Express, Vol.16, 045503 pp.1-5 (2023)<\/li>\n<li>T. Wakamatsu, H. Takane, <span style=\"text-decoration: underline;\">K. Kaneko<\/span>, T. Araki, and K. Tanaka, \u201cInfluence of HCl concentration in source solution and growth temperature on formation of \u03b1-Ga2O3 film via mist-CVD process\u201d Japanese Journal of Applied Physic Vol.62 No.SF pp.SF1024(1-7) (2023)<\/li>\n<li>T. Onuma, K. Kudo, M. Ono, W. Kosaka, K. Shima, K. Ishii, <span style=\"text-decoration: underline;\">K. Kaneko<\/span>, Y. Ota, T. Yamaguchi, \u00a0 \u00a0 \u00a0 \u00a0 \u00a0\u00a0 K. Kojima, S. Fujita, S. F. Chichibu, \u201cSteady-state and dynamic characteristics of deep UV luminescence in rock salt-structured MgxZn1\u2212xO\u201d Journal of Applied Physic Vol.134, pp. 025102(1-11) (2023)<\/li>\n<li>S. Yamashita, R. Moriya, H. Takane, Y. Wada,Y. Yamafuji,J. Kikawa, M. Matsukura, T. Kojima, T. Shinohe, <span style=\"text-decoration: underline;\">K. Kaneko<\/span>, and T. Araki, \u201cGrowth of Ga2O3 Film on ScAlMgO4 Substrate by Mist- Chemical Vapor Deposition\u201d Japanese Journal of Applied Physic (2023)<\/li>\n<li>A. Taguchi, T. Yamamoto, <span style=\"text-decoration: underline;\">K. Kaneko<\/span>, K. Goto, T. Onuma, T. Honda, Y. Kumagai, S. Fujita, T. Yamaguchi, \u201cGrowth of \u03b1-In2O3 films with different concentrations of In2O3 powder used as source precursor by mist CVD\u201d Japanese Journal of Applied Physic (2023)<\/li>\n<li>T. Wakamatsu, Y. Isobe, H. Takane, <span style=\"text-decoration: underline;\">K. Kaneko<\/span>, K. Tanaka, \u201cSchottky Barrier Diode Based on Ge-Doped \u03b1\u2212Ga2O3 Films Grown by Mist-CVD Method\u201d IEEE Xplore 2023 IEEE CPMT Symposium Japan pp.192-195<\/li>\n<\/ol>\n<h2 id=\"2\">\u56fd\u969b\u4f1a\u8b70\u767a\u8868(\u62db\u5f85)<\/h2>\n<ol>\n<li>H. Takane, Y. Ota, T. Wakamatsu, T. Araki, K. Tanaka and <span style=\"text-decoration: underline;\">K. Kaneko<\/span>, &#8220;<span style=\"text-decoration: underline;\"><span style=\"color: #000000; text-decoration: underline;\"><a href=\"https:\/\/spie.org\/photonics-west\/presentation\/Development-of-a-novel-rutile-type-SnO2-GeO2-SiO2-alloy\/12422-43?enableBackToBrowse=true&amp;SSO=1\" style=\"color: #000000; text-decoration: underline;\">Development of a novel rutile-type SnO2-GeO2-SiO2 alloy system<\/a><\/span><\/span>&#8221; SPIE Photonic WEST (San Francisco, USA, 2023\u5e742\u67081\u65e5 )<\/li>\n<li><u>K. Kaneko<\/u>, \u201cGermanium dioxide (GeO2) as a new power device material\u201d The 6th International Workshop on Ultraviolet Materials and Devices (Metz, france, 2023\u5e746\u67088\u65e5)<\/li>\n<li><u>K. Kaneko<\/u>, \u201cNew material for power device : GeO2\u201d Fall meeting of European Materials Research Society (Warsow, Poland, 2023\u5e749\u670819\u65e5)<\/li>\n<li><u>K. Kaneko<\/u>, \u201cEvolution of GeO2 as a power device material\u201d 36th International Microprocesses and Nanotechnology Conference (MNC 2023)\u00a0 (Sapporo, Japan, 2023\u5e7411\u670815\u65e5)<\/li>\n<\/ol>\n<h2 id=\"2\">\u56fd\u5185\u4f1a\u8b70\u767a\u8868(\u62db\u5f85)<\/h2>\n<ol>\n<li><u>\u91d1\u5b50\u5065\u592a\u90ce\u00a0<\/u>\u00a0\u300c\u9ad8\u54c1\u8cea\u4e8c\u9178\u5316\u30b2\u30eb\u30de\u30cb\u30a6\u30e0\u8584\u819c\u306e\u5408\u6210\u3068\u7269\u6027\u958b\u62d3\u300d\u4e5d\u5dde\u5927\u5b66\u3000\u5fdc\u7528\u529b\u5b66\u7814\u7a76\u6240\u3000RIAM\u30d5\u30a9\u30fc\u30e9\u30e02023\u30002023\u5e746\u67088\u65e5\u3000(\u30cf\u30a4\u30d6\u30ea\u30c3\u30c9)<\/li>\n<li><u>\u91d1\u5b50\u5065\u592a\u90ce<\/u>\u00a0 \u300c\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u5fdc\u7528\u3092\u76ee\u6307\u3057\u305f\u9178\u5316\u7269\u306b\u3088\u308bpn\u63a5\u5408\u306e\u53ef\u80fd\u6027\u300d\u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u5fdc\u7528\u96fb\u5b50\u7269\u6027\u5206\u79d1\u4f1a\u30fb\u7d50\u6676\u5de5\u5b66\u5206\u79d1\u4f1a\u5408\u540c\u7814\u7a76\u4f1a\u30002023\u5e746\u670813\u65e5<\/li>\n<li><u>\u91d1\u5b50\u5065\u592a\u90ce<\/u>\u00a0 \u300c\u65b0\u3057\u3044\u9178\u5316\u7269\u306e\u8a71\uff1a\u5408\u6210\u304c\u96e3\u3057\u3044\u5316\u5408\u7269\u3092\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u306b\u5fdc\u7528\u3059\u308b\u300d\u8868\u9762\u6280\u8853\u5354\u4f1a\u95a2\u897f\u652f\u90e8\u7b2c\uff11\u56de\u8868\u9762\u7269\u6027\u7814\u7a76\u4f1a\u30002023\u5e746\u670816\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span> \u300c\u30df\u30b9\u30c8CVD\u6cd5\u306b\u3088\u308b\u6750\u6599\u63a2\u7d22\u3068\u3055\u307e\u3056\u307e\u306a\u5fdc\u7528\u4f8b\u300d<br \/>\u5fdc\u7528\u7269\u7406\u5b66\u4f1a\u6771\u6d77\u652f\u90e8\u57fa\u790e\u30bb\u30df\u30ca\u30fc\u30002023\u5e749\u67088\u65e5<\/li>\n<\/ol>\n<p>\u00a0\u00a0\u00a0 (\u7523\u5b98\u5b66\uff09<\/p>\n<ol>\n<li><span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u3000\u300c\u65b0\u3057\u3044\u30d1\u30ef\u30fc\u534a\u5c0e\u4f53\u6750\u6599\uff1a\u4e8c\u9178\u5316\u30b2\u30eb\u30de\u30cb\u30a6\u30e0(GeO2)\u300d\u4eac\u90fd\u5e9c\u4e3b\u50ac\u3000ZET-valley\u7814\u7a76\u4f1a\u3000EV\u5206\u91ce\u5206\u79d1\u4f1a\u30002023\u5e741\u670825\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u3000\u300c\u5927\u5b66\u306e\u7814\u7a76\u8005\u3068\u30b9\u30bf\u30fc\u30c8\u30a2\u30c3\u30d7 \u4f5c\u3063\u3066\u7d42\u308f\u308a\u3067\u306f\u306a\u3044\u3001\u4f1a\u793e\u306e\u6210\u9577\u306e\u305f\u3081\u306b\u306f\u300d\u7b2c4 \u56de \u95a2\u897f\u79c1\u7acb\u5927\u5b66 \u7523\u5b98\u5b66\u91d1\u9023\u643a\u63a8\u9032\u9023\u7d61\u4f1a\u30002023\u5e746\u670830\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u3000\u300c\u30ac\u30ea\u30a6\u30e0\u3001\u30b2\u30eb\u30de\u30cb\u30a6\u30e0\u306e\u8f38\u51fa\u898f\u5236\u3068\u65e5\u672c\u306e\u30c6\u30c3\u30af\u7523\u696d\u3078\u306e\u5f71\u97ff\u300dSBI\u8a3c\u5238\u30bb\u30df\u30ca\u30fc\u30002023\u5e747\u670819\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u3000\u300c\u5927\u5b66\u306e\u7814\u7a76\u8005\u3068\u771f\u306e\u793e\u4f1a\u5b9f\u88c5\u534a\u5c0e\u4f53\u30c7\u30a3\u30fc\u30d7\u30c6\u30c3\u30af\u30d9\u30f3\u30c1\u30e3\u30fc2\u793e\u306e\u5275\u696d\u3068\u7814\u7a76\u8005\u306e\u5f79\u5272\u306b\u3064\u3044\u3066\u300d\u7b2c3\u56deChallenge\u4e07\u535a\u30002023\u5e7411\u670822\u65e5<\/li>\n<\/ol>\n<h2 id=\"2\">\u56fd\u969b\u4f1a\u8b70\u767a\u8868<\/h2>\n<ol>\n<li><span style=\"text-decoration: underline;\">Y. Shimizu<\/span>, <span style=\"text-decoration: underline;\">T. Otsuka<\/span>, <span style=\"text-decoration: underline;\">T. Hattori<\/span>, T. Araki, <u>K. Kaneko<\/u><br \/>&#8220;Fabrication of GeO<sub>2 <\/sub>thin films on 3C-SiC substrates&#8221;<br \/>European Materials Research Society\u30002023\u5e749\u670818\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">T. Otsuka,<\/span> <span style=\"text-decoration: underline;\">T. Hattori<\/span>, <span style=\"text-decoration: underline;\">Y. <\/span><span style=\"text-decoration: underline;\">Shimizu<\/span>, T. Araki, <u>K. Kaneko<\/u><br \/>&#8220;A growth of (Ge,Ti)O2 alloy thin films for p-type UWBG semiconductor&#8221;<br \/>European Materials Research Society\u30002023\u5e749\u670818\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">T. Hattori<\/span>, T. Tanaka, <span style=\"text-decoration: underline;\">Y. Shimizu<\/span>, <span style=\"text-decoration: underline;\">T. Otsuka<\/span>, T. Araki, <u>K. Kaneko<\/u><br \/>&#8220;Fabrication of indium tin oxide thin films with conductivity and corrosion-resistant for metal separator of fuel cells&#8221;<br \/>European Materials Research Society\u30002023\u5e749\u670818\u65e5<\/li>\n<\/ol>\n<h2>\u56fd\u5185\u4f1a\u8b70\u767a\u8868<\/h2>\n<ol>\n<li><span style=\"text-decoration: underline;\">\u670d\u90e8\u592a\u653f<\/span>\u3001\u7530\u4e2d\u5b5d\u3001<span style=\"text-decoration: underline;\">\u83ca\u6c60\u745b\u55e3<\/span>\u3001<span style=\"text-decoration: underline;\">\u5927\u585a\u77e5\u7d00<\/span>\u3001\u8352\u6728\u52aa\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span> <br \/>\u300c\u56fa\u4f53\u9ad8\u5206\u5b50\u5f62\u71c3\u6599\u96fb\u6c60 (PEFC)\u7528\u91d1\u5c5e\u30bb\u30d1\u30ec\u30fc\u30bf\u5fdc\u7528\u3092\u76ee\u6307\u3057\u305fITO\u8584\u819c\u306e\u4f5c\u88fd\u300d<br \/>2022\u5e74\u5ea6\u7b2c4\u56de\u534a\u5c0e\u4f53\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u90e8\u9580\u59d4\u54e1\u4f1a\u7b2c3\u56de\u7814\u7a76\u4f1a\u30002023\u5e741\u670821\u65e5<\/li>\n<li>\u592a\u7530 \u512a\u4e00\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50 \u5065\u592a\u90ce<\/span>\u3001\u5c3e\u6cbc \u731b\u5100\u3001\u85e4\u7530\u9759\u96c4\u300c\u8d85\u30ef\u30a4\u30c9\u30d0\u30f3\u30c9\u30ae\u30e3\u30c3\u30d7\u9178\u5316\u7269\u6df7\u6676\u306e\u30d0\u30ea\u30ac\u6027\u80fd\u6307\u6570\u306e\u8a55\u4fa1\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670815\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">\u5927\u585a\u77e5\u7d00<\/span>\u3001\u83ca\u6c60\u745b\u55e3\u3001\u670d\u90e8\u592a\u653f\u3001\u8352\u6728\u52aa\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u300c\u9023\u7d9a\u7d44\u6210\u50be\u659cRS-MgZnO\u8584\u819c\u306e\u6210\u9577\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670815\u65e5<\/li>\n<li>\u65e5\u4e0b\u7693\u4e5f\u3001\u9ad8\u5742\u4e98\u3001\u5c0f\u5ddd\u5e83\u592a\u90ce\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u3001\u5c71\u53e3\u667a\u5e83\u3001\u672c\u7530\u5fb9\u3001\u85e4\u7530\u9759\u96c4\u3001\u5c3e\u6cbc\u731b\u5100<br \/>\u300c\u5ca9\u5869\u69cb\u9020\u9178\u5316\u30de\u30b0\u30cd\u30b7\u30a6\u30e0\u4e9c\u925b\u8584\u819c\u306e\u771f\u7a7a\u7d2b\u5916\u9818\u57df\u3067\u306e\u5149\u96fb\u6d41\u30b9\u30da\u30af\u30c8\u30eb\uff08II\uff09\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670815\u65e5<\/li>\n<li>\u677e\u7530\u771f\u6a39\u3001\u5c0f\u5ddd\u5e83\u592a\u90ce\u3001\u592a\u7530\u512a\u4e00\u3001\u5c71\u53e3\u667a\u5e83\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u3001\u85e4\u7530\u9759\u96c4\u3001\u672c\u7530\u5fb9\u3001\u5c3e\u6cbc\u731b\u5100<br \/>\u300c\u30df\u30b9\u30c8CVD\u6cd5\u306b\u3088\u308bIII\u65cf\u30c9\u30fc\u30d7\u5ca9\u5869\u69cb\u9020MgZnO\u8584\u819c\u6210\u9577\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670815\u65e5<\/li>\n<li>\u9ad8\u6839\u502b\u53f2\u3001\u5927\u5cf6\u5b5d\u4ec1\u3001\u7530\u4e2d\u52dd\u4e45\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u300cTiO2 (110) \u57fa\u677f\u4e0a\u30eb\u30c1\u30eb\u578bSnO2\u306e\u9078\u629e\u6210\u9577\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670815\u65e5<\/li>\n<li>\u795e\u91ce\u8389\u8863\u5948\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u3001\u85e4\u7530\u9759\u96c4\u300c\u30b5\u30d5\u30a1\u30a4\u30a2\u57fa\u677f\u4e0a\u03b1-(AlxGa1-x)2O3 \u8584\u819c\u306e\u71b1\u7684\u5b89\u5b9a\u6027\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670815\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">\u83ca\u6c60\u745b\u55e3<\/span>\u3001<span style=\"text-decoration: underline;\">\u670d\u90e8\u592a\u653f<\/span>\u3001<span style=\"text-decoration: underline;\">\u5927\u585a\u77e5\u7d00<\/span>\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u300c\u81ed\u7d20\u5316\u5408\u7269\u3092\u7528\u3044\u305fp\u578b\u03b1-(Ir,Ga)2O3\u6df7\u6676\u8584\u819c\u306e\u9ad8\u901f\u6210\u9577\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670816\u65e5<\/li>\n<li>\u7530\u53e3\u7fa9\u58eb\u3001\u5c71\u5bfa\u771f\u7406\u3001\u5c71\u672c\u62d3\u5b9f\u3001\u6797\u4f51\u54c9\u3001\u6751\u5c71\u885b\u3001\u5c0f\u5ddd\u5e83\u592a\u90ce\u3001\u672c\u7530\u5fb9\u3001\u5c3e\u6cbc\u731b\u5100\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u3001\u76f8\u5ddd\u771f\u4e5f\u3001\u85e4\u7530\u9759\u96c4\u3001\u5c71\u53e3\u667a\u5e83<br \/>\u300cMist CVD\u6cd5\u306b\u3088\u308a\u6210\u9577\u3057\u305f\u03b1-In2O3\u8584\u819c\u306e\u4f4e\u30ad\u30e3\u30ea\u30a2\u6fc3\u5ea6\u5316\u3068MOSFET\u88fd\u4f5c\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670816\u65e5<\/li>\n<li>\u52a0\u85e4\u98af\u771f\u3001\u5c71\u4e0b\u4fee\u5e73\u3001\u548c\u7530\u9091\u4e00\u3001\u9ad8\u6839\u502b\u53f2\u3001\u5c71\u85e4\u7950\u4eba\u3001\u57ce\u5ddd\u6f64\u4e8c\u6717\u3001\u677e\u5009\u8aa0\u3001\u5c0f\u5cf6\u5b5d\u5e83\u3001\u56db\u6238\u5b5d\u3001\u51fa\u6d66\u6843\u5b50\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u3001\u8352\u6728 \u52aa<br \/>\u300c\u30df\u30b9\u30c8CVD\u6cd5\u306b\u3088\u308bScAlMgO4\u57fa\u677f\u4e0aGa2O3\u6210\u9577\u306e\u6210\u9577\u6e29\u5ea6\u4f9d\u5b58\u6027\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670816\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">\u670d\u90e8\u592a\u653f<\/span>\u3001\u7530\u4e2d\u8003\u3001<span style=\"text-decoration: underline;\">\u83ca\u6c60\u745b\u55e3<\/span>\u3001<span style=\"text-decoration: underline;\">\u5927\u585a\u77e5\u7d00<\/span>\u3001\u8352\u6728\u52aa\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<\/span>\u300c\u71c3\u6599\u96fb\u6c60\u30bb\u30d1\u30ec\u30fc\u30bf\u7528ITO\u8584\u819c\u306e\u4f5c\u88fd\u300d<br \/>2023\u5e74\u7b2c70\u56de \u5fdc\u7528\u7269\u7406\u5b66\u4f1a \u6625\u5b63\u5b66\u8853\u8b1b\u6f14\u4f1a\u30002023\u5e743\u670817\u65e5<\/li>\n<li><span style=\"text-decoration: underline;\">\u670d\u90e8\u592a\u653f<\/span>\u3001\u7530\u4e2d\u8003\u3001<span style=\"text-decoration: underline;\">\u5927\u585a\u77e5\u7d00<\/span>\u3001<span style=\"text-decoration: underline;\">\u6e05\u6c34\u60a0\u540f<\/span>\u3001\u8352\u6728\u52aa\u3001<span style=\"text-decoration: underline;\">\u91d1\u5b50\u5065\u592a\u90ce<br \/><\/span>\u300c\u71c3\u6599\u96fb\u6c60\u30bb\u30d1\u30ec\u30fc\u30bf\u5fdc\u7528\u3092\u76ee\u6307\u3057\u305fITO\u8584\u819c\u6210\u9577\u306b\u95a2\u3059\u308b\u7814\u7a76\u300d<br \/>\u4ee4\u548c5\u5e74\u5ea6 \u65e5\u672c\u6750\u6599\u5b66\u4f1a \u534a\u5c0e\u4f53\u30a8\u30ec\u30af\u30c8\u30ed\u30cb\u30af\u30b9\u90e8\u9580\u59d4\u54e1\u4f1a\u7b2c2\u56de\u7814\u7a76\u4f1a<br \/>\u30ca\u30ce\u6750\u6599\u90e8\u9580\u59d4\u54e1\u4f1a\u7b2c3\u56de\u7814\u7a76\u4f1a\u30002023\u5e7411\u670825\u65e5<\/li>\n<\/ol>\n","protected":false},"excerpt":{"rendered":"<p>\u67fb\u8aad\u4ed8\u304d\u7814\u7a76\u8ad6\u6587 \u00a0\u00a0\u00a0 \u3000\uff08Review\u8ad6\u6587\uff09 K. Kaneko, S. Fujita, T. Shinohe, and K. Tanaka, &#8220;Progress of \u03b1-Ga2O3 for Actual Device Applications&#8221; Japanese Journal of Applied Physic Vol.62, No. SF pp.SF0803(1-10) (2023) \u00a0\u00a0 \uff08\u62db\u5f85\u8ad6\u6587\uff09 H. Takane, H. Izumi, H. Hojo, T. Wakamatsu, T. Araki, K. Tanaka, and\u00a0K. Kaneko, \u201cEffect of dislocations and impurities on carrier transport in \u03b1-Ga2O3 [&hellip;]<\/p>\n","protected":false},"author":2,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"footnotes":""},"class_list":["post-456","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/kaneko-lab.ritsumei.ac.jp\/en\/wp-json\/wp\/v2\/pages\/456","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/kaneko-lab.ritsumei.ac.jp\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/kaneko-lab.ritsumei.ac.jp\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/kaneko-lab.ritsumei.ac.jp\/en\/wp-json\/wp\/v2\/users\/2"}],"replies":[{"embeddable":true,"href":"https:\/\/kaneko-lab.ritsumei.ac.jp\/en\/wp-json\/wp\/v2\/comments?post=456"}],"version-history":[{"count":33,"href":"https:\/\/kaneko-lab.ritsumei.ac.jp\/en\/wp-json\/wp\/v2\/pages\/456\/revisions"}],"predecessor-version":[{"id":753,"href":"https:\/\/kaneko-lab.ritsumei.ac.jp\/en\/wp-json\/wp\/v2\/pages\/456\/revisions\/753"}],"wp:attachment":[{"href":"https:\/\/kaneko-lab.ritsumei.ac.jp\/en\/wp-json\/wp\/v2\/media?parent=456"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}